Alexandros N. Kalarakis is Assistant Professor of the Mechanical Engineering Department at the University of the Peloponnese. He obtained his Bachelor degree in Physics from the University of Patras and his M.Sc. and Ph.D. degrees from the Chemical Engineering Department at the University of Patras. He is the director of the "Analysis of Materials and Constructions" (LAMS-UOP) laboratory of the Department of Mechanical Engineering. His research interests include the prototyping and characterization of meso- and nano-structured materials with techniques such as Microscopy (Scattering Electron Microscopy - SEM), Spectroscopy (X-ray Diffraction - XRD) and optical profilometry as well as the theoretical and experimental modeling of materials and transport phenomena and in particular the phenomena that govern interfaces in physical processes. He is currently the Leading Scientist and operator of the Scanning Electron Microscopy (SEM) unit of the Faculty of Engineering of the University of Peloponnese. 
He has more than 75 publications, in peer-reviewed international scientific journals (31), conferences (37) and chapters in books (3) which are recognized of more than 580 citations (h-index=14). He is a co-investigator on a patent (Robotic femoral-leg guardian - (Ο.Β.Ι.:1009888/18-12-2020). He has extensive research experience as he has participated since 1996 in more than 20 research projects. He is a reviewer in international magazines.
site: http://mech.uop.gr/index.php/kalarakisalexandros/
ORCID iD: https://orcid.org/0000-0002-9387-6612  
Scopus ID: http://www.scopus.com/inward/authorDetails.url?authorID=23568136100&partnerID=MN8TOARS
Web of Science ID: https://publons.com/researcher/4529108/alexandros-kalarakis/  
Google Scholar: https://scholar.google.com/citations?user=izVFgaWskWoC&hl=el&oi=ao     
Semantic Scholar: https://www.semanticscholar.org/author/Alexandros-Kalarakis/1838435  

Theoretical and experimental modeling and computer simulation of transport phenomena and in particular the phenomena that govern interfaces in natural processes, material modeling. Characterization of nanostructured materials with techniques such as Microscopy (Scanning Electron Microscopy - SEM), Spectroscopy (X-ray Diffraction - XRD) and optical profilometry.